TY  - JOUR
AU  - Jr., William Egelhoff
AU  - Gan, L
AU  - Ettendgui, H
AU  - Kadmon, Y
AU  - Powell, Cedric
AU  - Chen, P
AU  - Shapiro, Alexander
AU  - McMichael, Robert
AU  - Mallett, J
AU  - Moffat, Thomas
AU  - Stiles, Mark
C2  - Journal of Applied Physics
DA  - 2004-06-01 00:06:00
LA  - en
M1  - 95
PB  - Journal of Applied Physics
PY  - 2004
TI  - Artifacts in Ballistic Magnetoresistance Measurements
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=620557
ER  -