TY  - JOUR
AU  - Robert McMichael
AU  - Mark Stiles
AU  - P Chen
AU  - William Egelhoff Jr.
C2  - Journal of Applied Physics
DA  - 1998-01-01 00:01:00
LA  - en
M1  - 83
PB  - Journal of Applied Physics
PY  - 1998
TI  - Ferromagnetic Resonance Linewidth in Thin Films Coupled to NiO
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=620492
ER  -