TY  - JOUR
AU  - Chad Snyder
AU  - F Mopsik
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 2001-10-01 00:10:00
LA  - en
M1  - 50
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 2001
TI  - A Precision Capacitance Cell for Measurement of Thin Film Out-of-Plane Expansion Part III. Conducting and Semiconducting Materials
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852836
ER  -