TY - GEN AU - J Chiao AU - Julian Goldman AU - David Heck AU - Peter Kazanzides AU - William Peine AU - James Stiehl AU - Dwight Yen AU - Nicholas Dagalakis C2 - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD DA - 2008-04-30 00:04:00 LA - en PB - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD PY - 2008 TI - Metrology and Standards Needs of Some Categories of Medical Devices UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=823042 ER -