TY  - JOUR
AU  - Estler, William
AU  - Queen, Y
AU  - Evans, Christopher
C2  - Cirp Annals-Manufacturing Technology
DA  - 2000-01-01 00:01:00
LA  - en
M1  - 49 (1)
PB  - Cirp Annals-Manufacturing Technology
PY  - 2000
TI  - Angle Metrology of Dispersion Prisms
ER  -