TY - JOUR AU - Chad Snyder AU - F Mopsik C2 - Review of Scientific Instruments DA - 1999-01-01 00:01:00 LA - en M1 - 69(11) PB - Review of Scientific Instruments PY - 1999 TI - A precision capacitance cell for measurement of thin film out-of-plane expansion. I. Thermal expansion UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854003 ER -