TY  - CONF
AU  - Jarred Heigel
AU  - Eric Whitenton
C2  - Proceedings of the ASME 2009 International Manufacturing Science and Engineering Conference, West Lafayette, IN, US
DA  - 2009-10-07 00:10:00
LA  - en
PB  - Proceedings of the ASME 2009 International Manufacturing Science and Engineering Conference, West Lafayette, IN, US
PY  - 2009
TI  - The Effects of Integration Time and Size-of-Source on the Temperature Measurement of Segmented Chip Formation Using Infrared Thermography
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902621
ER  -