TY - CHAP AU - Gert Roebben AU - Vincent Hackley AU - Hendrik Emons C2 - Metrology and Standardization of Nanomaterials, Wiley VCH, Weinheim, -1 DA - 2017-03-01 00:03:00 LA - en PB - Metrology and Standardization of Nanomaterials, Wiley VCH, Weinheim, -1 PY - 2017 TI - Reference nanomaterials to improve the reliability of nanoscale measurements UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=921176 ER -