TY  - JOUR
AU  - Wang, Bin
AU  - Suehle, John
AU  - Vogel, Eric
AU  - Bernstein, J
C2  - IEEE Electron Device Letters
DA  - 2001-03-01 00:03:00
LA  - en
M1  - 22
PB  - IEEE Electron Device Letters
PY  - 2001
TI  - Time Dependent Breakdown of Ultra-Thin Gate Dielectrics Under Pulsed Biased Stress
ER  -