TY  - CONF
AU  - Papa Amoah
AU  - Jesus Perez
AU  - Yaw Obeng
C2  - 2020 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, April 6-9, EDINBURGH, UNITED 
KINGDOM, Edinburgh, UK
DA  - 2020-06-04 00:06:00
DO  - https://doi.org/10.1109/ICMTS48187.2020.9107926.
LA  - en
PB  - 2020 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, April 6-9, EDINBURGH, UNITED 
KINGDOM, Edinburgh, UK
PY  - 2020
TI  - Application of Broadband RF Metrology to Integrated Circuit Interconnect Reliability Analyses: Monitoring Copper Interconnect Corrosion in 3D-ICs
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929468
ER  -