TY  - JOUR
AU  - Erin Flater
AU  - Arya Mugdha
AU  - Saurabh Gupta
AU  - William Hudson
AU  - Abbigail Fahrenkamp
AU  - Jason Killgore
AU  - Jesse Wilson
C2  - Measurement Science & Technology
DA  - 2020-05-29 00:05:00
LA  - en
PB  - Measurement Science & Technology
PY  - 2020
TI  - Error Estimation and Enhanced Stiffness Sensitivity in Contact Resonance Force Microscopy with a Multiple Arbitrary Frequency Lock-In Amplifier (MAFLIA)
ER  -