TY  - CONF
AU  - Nick Fletcher
AU  - Gert Rietveld
AU  - James Olthoff
AU  - Ilya Budovsky
C2  - Conference on Precision Electromagnetic Measurements, Rio de Janeiro, BR
DA  - 2014-10-02 00:10:00
DO  - https://doi.org/10.1109/CPEM.2014.6898444
LA  - en
PB  - Conference on Precision Electromagnetic Measurements, Rio de Janeiro, BR
PY  - 2014
TI  - Predicted impact of latest h and e values on resistance and voltage traceability in the new SI (Systeme International)
ER  -