TY - JOUR AU - Duane McCrory AU - Mark Anders AU - Jason Ryan AU - Pragya Shrestha AU - Kin Cheung AU - Patrick Lenahan AU - Jason Campbell C2 - Review of Scientific Instruments DA - 2019-01-14 00:01:00 DO - https://doi.org/10.1063/1.5053665 LA - en M1 - 90 PB - Review of Scientific Instruments PY - 2019 TI - Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=926629 ER -