TY  - JOUR
AU  - Binhui Hu
AU  - Erick Ochoa
AU  - Daniel Sanchez
AU  - Justin Perron
AU  - Neil Zimmerman
AU  - Michael Stewart
C2  - Journal of Applied Physics
DA  - 2018-10-09 00:10:00
DO  - https://doi.org/10.1063/1.5048013
LA  - en
M1  - 124
PB  - Journal of Applied Physics
PY  - 2018
TI  - Effect of device design on charge offset drift in Si/SiO2 single electron devices
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=926169
ER  -