TY  - JOUR
AU  - James Marro
AU  - Chukwudi Okoro
AU  - Yaw Obeng
AU  - Kathleen Richardson
C2  - Microelectronics Reliability
DA  - 2017-06-28 00:06:00
DO  - https://doi.org/10.1149/2.1131707jes
LA  - en
M1  - 164
PB  - Microelectronics Reliability
PY  - 2017
TI  - The Impact of Organic Additives On Copper Trench Microstructure
ER  -