TY  - JOUR
AU  - Patrick Lenahan
AU  - Jason Campbell
AU  - A.T. Krishnan
AU  - S. Krishnan
C2  - IEEE Transactions on Device and Materials Reliability
DA  - 2011-06-01 00:06:00
LA  - en
M1  - 11
PB  - IEEE Transactions on Device and Materials Reliability
PY  - 2011
TI  - A Model for NBTI in Nitrided Oxide MOSFETs Which Does Not Involve Hydrogen or Diffusion
ER  -