TY  - JOUR
AU  - Eickhoff, M
AU  - Hall, John
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 1995-01-01 00:01:00
LA  - en
M1  - 44
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 1995
TI  - Optical frequency standard at 532 nm
ER  -