TY  - CONF
AU  - C. Chiang
AU  - W Sakai
C2  - Electrically Based Microstructural Characterization, Symposium R | | Symposium R Electrically Based Microstructural Characterization III | Materials Research Society, MA, MA
DA  - 2002-01-01 00:01:00
LA  - en
M1  - 699
PB  - Electrically Based Microstructural Characterization, Symposium R | | Symposium R Electrically Based Microstructural Characterization III | Materials Research Society, MA, MA
PY  - 2002
TI  - Application of a Buffer Layer for the Dielectric Measurement of Thin Polymer Films
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852107
ER  -