TY  - GEN
AU  - Richard Geyer
AU  - Clifford Krowne
C2  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2000-08-01 00:08:00
LA  - en
PB  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2000
TI  - Microwave Dielectric Characterization of Unpatterned Thin Films Using a TE<sub>0&#947;&#325;</sub> Dielectric Resonator Technique Theory
ER  -