TY  - CONF
AU  - E. Vanzura
C2  - Proc., 1988 I IEEE Instrum. Meas. Tech. Conf., San Diego, CA
DA  - 1988-04-01 00:04:00
LA  - en
PB  - Proc., 1988 I IEEE Instrum. Meas. Tech. Conf., San Diego, CA
PY  - 1988
TI  - Automated System for Electromagnetic Field Generation and Immunity Testing
ER  -