TY  - JOUR
AU  - Martin, A.
AU  - O'Sullivan, P.
AU  - Mathewson, A.
AU  - Suehle, John
AU  - Chaparala, P
C2  - Solid-State Electronics
DA  - 1997-12-31 00:12:00
LA  - en
M1  - 41
PB  - Solid-State Electronics
PY  - 1997
TI  - Investigation of the Influence of Ramped Voltage Stress on Intrinsic tbd of MOS Gate Oxides
ER  -