TY  - CONF
AU  - Harry Schafft
AU  - John Albers
C2  - Proc., IEEE International Conference on Microelectronic Test Structures, Long Beach, CA, USA
DA  - 1988-12-31 00:12:00
LA  - en
PB  - Proc., IEEE International Conference on Microelectronic Test Structures, Long Beach, CA, USA
PY  - 1988
TI  - Thermal Interactions Between Electromigration Test Structures
ER  -