TY  - GEN
AU  - Jon Geist
AU  - A. Robinson
AU  - C. James
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1991-12-01 00:12:00
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1991
TI  - Numerical Modeling of Silicon Photodiodes for High-Accuracy Applications. Part III: Interpolating and Extrapolating Internal Quantum-Efficiency Calibrations
ER  -