TY - CONF AU - James Baker-Jarvis AU - Chriss Jones C2 - Proc., Mater. Res. Soc. Symp. , San Francisco, CA DA - 1995-04-01 00:04:00 LA - en PB - Proc., Mater. Res. Soc. Symp. , San Francisco, CA PY - 1995 TI - Dielectric Measurements on Printed-Wiring and Circuit Boards, Thin Films, and Substrates: An Overview ER -