TY  - JOUR
AU  - Thomas Witt
AU  - Yi-hua Tang
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 2005-04-01 00:04:00
LA  - en
M1  - 54
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 2005
TI  - Investigations of Noise in Measurements of Electronic Voltage Standards
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31722
ER  -