TY  - JOUR
AU  - Schafft, Harry
AU  - Erhart, D.
AU  - Gladden, W.
C2  - Microelectronics Reliability
DA  - 1997-12-31 00:12:00
LA  - en
M1  - 37
PB  - Microelectronics Reliability
PY  - 1997
TI  - Toward a Building-In Reliability Approach
ER  -