TY  - GEN
AU  - A Settle-Raskin
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2000-04-12 00:04:00
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2000
TI  - NIST List of Publications LP 103, National Semiconductor Metrology Program/Semiconductor Electronics Division, 1990-1999
ER  -