TY  - GEN
AU  - Knight, Stephen
AU  - Settle-Raskin, A
C2  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1999-05-01 00:05:00
LA  - en
PB  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1999
TI  - The National Semiconductor Metrology Program, Project Portfolio, FY 1999
ER  -