TY - JOUR AU - Michael Postek AU - William Keery AU - Nolan Frederick C2 - Review of Scientific Instruments DA - 1990-06-01 00:06:00 LA - en M1 - 61 PB - Review of Scientific Instruments PY - 1990 TI - Low-Profile High-Efficiency Microchannel-Plate Detector System for Scanning Electron Microscopy Applications ER -