TY  - CONF
AU  - Roy Geiss
AU  - David Read
C2  - AIP Conference Proceedigs, Gaithersburg, MD, USA
DA  - 2007-03-05 00:03:00
LA  - en
PB  - AIP Conference Proceedigs, Gaithersburg, MD, USA
PY  - 2007
TI  - Need for Standardization of EBSD Measurements for Microstructural Characterization of Thin Film Structures
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50521
ER  -