TY  - CONF
AU  - Evans, J
AU  - Deshayes, Laurent
AU  - Bhat, D
AU  - Batzer, S
C2  - Proceedings of the Microscopy and Microanalysis 2005, Honolulu, HI, USA
DA  - 2005-01-01 00:01:00
LA  - en
PB  - Proceedings of the Microscopy and Microanalysis 2005, Honolulu, HI, USA
PY  - 2005
TI  - A Failure Analysis of an Experimental AIMgB14 Cutting Tools
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=822257
ER  -