TY  - GEN
AU  - Emre Yarimbiyik
AU  - Harry Schafft
AU  - Richard Allen
AU  - Mona Zahgoul
AU  - David Blackburn
C2  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2006-02-01 00:02:00
DO  - https://doi.org/10.6028/NIST.IR.7234
LA  - en
PB  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2006
TI  - Implementation of Simulation Program for Modeling the Effective Resistivity of Nanometer Scale Film and Line Interconnects
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32006
ER  -