TY  - JOUR
AU  - Michael Janezic
AU  - Dylan Williams
AU  - V. Blaschke
AU  - A. Karamcheti
AU  - Fengbo Hang
C2  - IEEE Transactions on Microwave Theory and Techniques
DA  - 2003-01-01 00:01:00
DO  - https://doi.org/10.1109/TMTT.2002.806925
LA  - en
M1  - 51
PB  - IEEE Transactions on Microwave Theory and Techniques
PY  - 2003
TI  - Permittivity Characterization of Low-k Thin films from Transmission-Line Measurements
ER  -