TY  - GEN
AU  - Jon Geist
AU  - Tina Kohler
AU  - R. Goebel
AU  - A. Robinson
AU  - C. James
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1991-08-30 00:08:00
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1991
TI  - Numerical Modeling of Silicon Photodiodes for High-Accuracy Applications. Part II: Interpreting Oxide-Bias Experiments
ER  -