TY - CONF AU - G. Campisi AU - Peter Roitman AU - G. Shontz C2 - Proc., Third Workshop on Radiation-Induced and/or Process-Related Electrically Active Defects in Semiconductor-Insulator Systems, Research Triangle Park, NC, USA DA - 1991-12-31 00:12:00 LA - en PB - Proc., Third Workshop on Radiation-Induced and/or Process-Related Electrically Active Defects in Semiconductor-Insulator Systems, Research Triangle Park, NC, USA PY - 1991 TI - The Role of Annealing Conditions on the Radiation Response of Backgate MOSFETs, Extended Abstract ER -