TY  - JOUR
AU  - John Suehle
AU  - P Chaparala
C2  - Microelectronics Journal
DA  - 1996-12-31 00:12:00
LA  - en
M1  - 27
PB  - Microelectronics Journal
PY  - 1996
TI  - Characterization of Time-Dependent Dielectric Breakdown in Intrinsic Thin SiO<sub>2</sub>
ER  -