TY  - JOUR
AU  - B. Steiner
AU  - J. Comas
AU  - W. Tseng
AU  - U. Laor
AU  - R. Dobbyn
C2  - Journal of Electronic Materials
DA  - 1993-08-01 00:08:00
LA  - en
M1  - 22
PB  - Journal of Electronic Materials
PY  - 1993
TI  - Defects in III-V Materials and the Accommodation of Strain in Layered Semiconductors
ER  -