TY  - CONF
AU  - John Moreland
AU  - Pavel Kabos
AU  - Albrecht Jander
AU  - M. Loehndorf
AU  - Robert McMichael
AU  - C Lee
C2  - Proc., SPIE, Micromachined Devices and Components IV, vol. 4176, Santa Clara, CA, USA
DA  - 2000-09-01 00:09:00
LA  - en
PB  - Proc., SPIE, Micromachined Devices and Components IV, vol. 4176, Santa Clara, CA, USA
PY  - 2000
TI  - Micromechanical Detectors for Ferromagnetic Resonance Spectroscopy
ER  -