TY  - GEN
AU  - James Baker-Jarvis
AU  - Michael Janezic
AU  - Billy Riddle
AU  - Christopher Holloway
AU  - Nicholas Paulter
AU  - J Blendell
C2  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2001-07-01 00:07:00
DO  - https://doi.org/10.6028/NIST.TN.1520
LA  - en
PB  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2001
TI  - Dielectric and Conductor-Loss Characterization and Measurements on Electronic Packaging Materials
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=20484
ER  -