TY  - CONF
AU  - Geiss, R.H.
AU  - Roshko, Alexana
AU  - Bertness, Kristine
AU  - Keller, T
C2  - Proc., 2003 TMS Annual Meeting, in Electron Microscopy: Its Role in Materials Science, eds. J.R. Weertman, M. Fine, K. Faber, W. King, and P. Liaw, San Diego, CA, USA
DA  - 2003-03-01 00:03:00
LA  - en
PB  - Proc., 2003 TMS Annual Meeting, in Electron Microscopy: Its Role in Materials Science, eds. J.R. Weertman, M. Fine, K. Faber, W. King, and P. Liaw, San Diego, CA, USA
PY  - 2003
TI  - Electron Backscatter Diffraction for Studies of Localized Deformation
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31485
ER  -