TY  - JOUR
AU  - David Bergman
AU  - Gerard Stenbakken
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 2006-08-01 00:08:00
LA  - en
M1  - 55
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 2006
TI  - Phase-Plane-Derived Distortion Modeling of a Fast and Accurate Digitizing Sampler
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32466
ER  -