TY - CONF AU - John Suehle AU - P Chaparala AU - C. Messick AU - W. Miller AU - K. Boyko C2 - Proc., 1994 IEEE International Reliability Physics Symposium, San Jose, CA, USA DA - 1994-12-31 00:12:00 LA - en PB - Proc., 1994 IEEE International Reliability Physics Symposium, San Jose, CA, USA PY - 1994 TI - Field and Temperature Acceleration of Time-Dependent Dielectric Breakdown in Intrinsic Thin SiO2 ER -