TY  - CONF
AU  - Wenyong Wang
AU  - Curt Richter
C2  - Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, MD, USA
DA  - 2007-09-30 00:09:00
LA  - en
PB  - Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, MD, USA
PY  - 2007
TI  - Spin-polarized Inelastic Electron Tunneling Spectroscopy of Molecular Magnetic Tunnel Junctions
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32589
ER  -