TY  - JOUR
AU  - Richard Van Brunt
AU  - Ken Stricklett
AU  - J. Steiner
AU  - S. Kulkarni
C2  - IEEE Transactions on Dielectrics and Electrical Insulation
DA  - 1992-02-01 00:02:00
LA  - en
PB  - IEEE Transactions on Dielectrics and Electrical Insulation
PY  - 1992
TI  - Recent Advances in Partial Discharge Measurement Capabilities at NIST
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=16575
ER  -