TY  - JOUR
AU  - Ranbir Singh
AU  - Allen Hefner Jr.
C2  - Journal of Solid-state Electronics
DA  - 2004-06-24 00:06:00
LA  - en
M1  - 48
PB  - Journal of Solid-state Electronics
PY  - 2004
TI  - Reliability of SiC MOS Devices
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31577
ER  -