TY  - CONF
AU  - Chen, Y
AU  - Suehle, John
AU  - Shen, Chien-Chung
AU  - Bernstein, J
AU  - Messick, C.
AU  - Chaparala, P
C2  - Proc., 1998 International Reliability Physics Symposium, Reno, NV, USA
DA  - 1998-06-01 00:06:00
LA  - en
PB  - Proc., 1998 International Reliability Physics Symposium, Reno, NV, USA
PY  - 1998
TI  - The Correlation of Highly Accelerated Q<sub>bd</sub> Tests to TDDB Life Tests for Ultra-Thin Gate Oxides
ER  -