TY - CONF AU - Michael Janezic AU - Jerzy Krupka AU - James Baker-Jarvis C2 - Intl. Conf. Advances in Processing, Testing and Applications of Dielectric Materials, Wroclaw, 1, PL DA - 2001-09-17 00:09:00 LA - en PB - Intl. Conf. Advances in Processing, Testing and Applications of Dielectric Materials, Wroclaw, 1, PL PY - 2001 TI - Nondestructive Permittivity Measurements of Dielectric Substrates Using Split-Cylinder and Split-Post Resonators ER -