TY  - JOUR
AU  - D. Tulchinsky
AU  - Michael Kelley
AU  - J. Bass
AU  - John Unguris
AU  - Joseph Dura
AU  - Julie Borchers
AU  - Charles Majkrzak
AU  - S. Hsu
AU  - R. Loloee
AU  - W. Pratt
C2  - Journal of Applied Physics
DA  - 2000-05-01 00:05:00
LA  - en
M1  - 87
PB  - Journal of Applied Physics
PY  - 2000
TI  - Magnetic depth profiling Co/Cu multilayers to investigate magnetoresistance (invited)
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32588
ER  -