TY - CONF AU - David Berning AU - Allen Hefner Jr. AU - J Rodriguez AU - Colleen Hood AU - Angel Rivera C2 - Proc., IEEE Industrial Applications Society Meeting, Tampa, FL, USA DA - 2006-10-01 00:10:00 LA - en PB - Proc., IEEE Industrial Applications Society Meeting, Tampa, FL, USA PY - 2006 TI - Generalized Test Bed for High-Voltage, High-Power SiC Device Characterization UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32317 ER -