TY  - JOUR
AU  - Richard Van Brunt
AU  - P. Von
AU  - T. Las
C2  - IEEE Proceedings - Science, Measurement and Technology, Special Issue
DA  - 1995-01-01 00:01:00
LA  - en
PB  - IEEE Proceedings - Science, Measurement and Technology, Special Issue
PY  - 1995
TI  - Nonstationary Behavior of Partial Discharge During Discharge-Induced Aging of Dielectrics
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=7739
ER  -